NEMS and Nanometrology

Nanoelectromechanical systems (NEMS)

Nanoelectromechanical systems (NEMS) are an interesting set of devices that can have many applications involving mass and force sensing as well as high quality-factor tunable resonators. We pursue the engineering of such devices utilizing novel materials including Graphene and Chalcogenides.

Key areas:

  • Combining graphene and chalcogenides for RF tunable resonators
  • Studying and probing extreme nonlinearity in Room Temperature NEMS


High-resolution KPM

Atomic force microscope (AFM) is a versatile and widely used tool to characterise surface properties at the nanoscale. We mainly use the AFM for topographical and electrical measurements. Our group has invented a modified AFM tip that can achieve an electrical resolution that is beyond the geometrical limitations of commercial AFM tips, advancing the field of nanomanufacturing and metrology


Nanoelectrodes offer to contact nanoscale objects (single molecules and nanocrystals). In our lab, we are utilising nanoelectrodes of graphene to reduce the contact area to these objects in order to avoid undesired gating or screening effect. We further implement those devices with phase-change materials to study the device physics at the nanoscale and thus, we are able to determine the fundamental scaling limits for potential memory-cell applications.